By Peter W. Hawkes
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This publication will introduce layout methodologies, often called Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which counterpoint the robustness of radio frequency (RF) and millimeter wave (mmWave) built-in circuits (ICs). those circuits are utilized in present and rising verbal exchange, computing, multimedia and biomedical items and microchips.
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