By Sleiman Bou-Sleiman,Mohammed Ismail
Read or Download Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering) PDF
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This e-book will introduce layout methodologies, referred to as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which complement the robustness of radio frequency (RF) and millimeter wave (mmWave) built-in circuits (ICs). those circuits are utilized in present and rising conversation, computing, multimedia and biomedical items and microchips.
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